PArk Systems

PArk Systems
NX BIO - Atomic Force Microscope

NX BIO - Atomic Force Microscope

Park NX-Bio enables that with its innovative in-liquid imaging Scanning Ion Conductance Microscopy (SICM) and its highly acclaimed Atomic Force Microscopy (AFM) technology.
NX-Wafer - Atomic Force Microscope

NX-Wafer - Atomic Force Microscope

Fully automated AFM solution for defect imaging and analysis that improves defect review productivity by up to 1,000%
002-000 NX20 Complete AFM System

002-000 NX20 Complete AFM System

Park NX20 is equipped with unique features that make it easier to uncover the reasons behind device failure and develop more creative solutions. Its unparalleled precision provides high resolution data that lets you focus on your ...
010-0020 NX10 Complete AFM System

010-0020 NX10 Complete AFM System

ark NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and b...
Page 1 of 1 (4 products)

    Brands